RMN-12PT300B
  • Manufacturer: Bruker
  • Cantilever Coating:
  • Tip Geometry: Solid Wire
  • Number of Cantilevers: 1個(gè)懸臂
    F9KHz K0.8N/m L300um
AFM探針描述

適用的Sample:
Ceramics,Other Hard Samples,Other Soft Sample,Polymers,Semiconductors

適用的AFM機(jī)型:
DimensionIcon,DimensionXR,Innova,JPK,MultiMode,Non-Bruker

適用的Work Mode:
CAFM,EFM,Electrical Spectroscopy,KPFM,PFM,SCM,TUNA

適用的Application:
Electrical

Coating 描述
tip coating --
Tip 規(guī)格
tip geometry Solid Wire
tip radius (Nom) <20nm
tip height 約100um
Cantilever 規(guī)格
cantilever geometry Rectangular
K(Nom) 0.8N/m
Frequency(Nom) 9KHz
length(Nom) 300um
thickness(Nom) --
cantilever material Solid Platinum
top layer back --
最新產(chǎn)品
Frequency
Nom: 70KHz
Spring Const.
Nom: 2.9N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom: 300KHz
Spring Const.
Nom: 42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom: 300KHz
Spring Const.
Nom: 42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom: 70KHz
Spring Const.
Nom: 2.9N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
探針對比
探針型號對比
添加型號
開始對比 最多4個(gè)
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