AFM探針描述
適用的Sample:
Ceramics,Other Hard Samples,Other Soft Sample,Polymers
適用的AFM機型:
DimensionIcon,DimensionXR,Innova,JPK,MultiMode,Non-Bruker
適用的Work Mode:
peakforce tapping,tapping or non-contact
適用的Application:
General Topography
Coating 描述
| cantilever Back side coating | Reflective Aluminum |
|---|---|
| tip coating | -- |
Tip 規(guī)格
| tip geometry | Visible Apex |
|---|---|
| tip radius (Nom) | 7nm |
| tip height | 9-19um |
| Front Angle (FA) | 0±1° |
| Back Angle (BA) | 35 ±1° |
| side Angle (SA) | 18 ±1° |
Cantilever 規(guī)格
| cantilever geometry | Rectangular |
|---|---|
| K(Nom) | 26N/m |
| Frequency(Nom) | 300KHz |
| length(Nom) | 160um |
| thickness(Nom) | 3.7um |
| cantilever material | 0.01 - 0.02 Ωcm Silicon |
| top layer back | 100nm of Al |
最新產(chǎn)品
Frequency
Nom:
70KHz
Spring Const.
Nom:
2.9N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom:
300KHz
Spring Const.
Nom:
42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom:
300KHz
Spring Const.
Nom:
42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
