AFM探針描述
適用的Sample:
Ceramics,Data Storage,Other Hard Samples,Other Soft Sample,Polymers,Semiconductors
適用的AFM機型:
DimensionIcon,DimensionXR,Innova,Non-Bruker
適用的Work Mode:
tapping or non-contact
適用的Application:
General Topography
Coating 描述
| cantilever Back side coating | Reflective Aluminum |
|---|---|
| tip coating | -- |
Tip 規(guī)格
| tip geometry | Standard (Steep) |
|---|---|
| tip radius (Nom) | 8nm |
| tip height | 10-15um |
| Front Angle (FA) | 25±2.5° |
| Back Angle (BA) | 15±2.5° |
| Side Angle (SA) | 22.5±2.5° |
Cantilever 規(guī)格
| cantilever geometry | Rectangular |
|---|---|
| K(Nom) | 48N/m |
| Frequency(Nom) | 190KHz |
| length(Nom) | 225um |
| thickness(Nom) | 7um |
| cantilever material | 0.01 - 0.025 Ωcm Antimony (n) doped Si |
| top layer back | -- |
最新產(chǎn)品
Frequency
Nom:
70KHz
Spring Const.
Nom:
2.9N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom:
300KHz
Spring Const.
Nom:
42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom:
300KHz
Spring Const.
Nom:
42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
