AFM探針描述
適用的Sample:
Data Storage,Semiconductors
適用的AFM機型:
Insight
適用的Work Mode:
Critical Dimension (CD) AFM
適用的Application:
Holes/ Trenches
Coating 描述
| cantilever Back side coating | Reflective Aluminum |
|---|---|
| tip coating | -- |
Tip 規(guī)格
| tip geometry | Critical Dimension (Overhang) |
|---|---|
| tip radius (Nom) | -- |
| tip height | 14-16um |
| Front Angle (FA) | 10±2° |
| Back Angle (BA) | 10 ±2° |
| Side Angle (SA) | 10 ±2° |
| Overhang | 5-15nm |
| Effective Length | 250-350nm |
| Tip Width | 80-100nm |
| Vertical Edge Height | <10nm |
Cantilever 規(guī)格
| cantilever geometry | Rectangular |
|---|---|
| K(Nom) | 35N/m |
| Frequency(Nom) | 350KHz |
| length(Nom) | 125um |
| thickness(Nom) | 4um |
| cantilever material | 0.01 - 0.02Ωcm Antimony (n) doped Si |
| top layer back | 40 ±10 nm of Al |
最新產品
Frequency
Nom:
70KHz
Spring Const.
Nom:
2.9N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom:
300KHz
Spring Const.
Nom:
42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom:
300KHz
Spring Const.
Nom:
42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
