• Manufacturer: Bruker
  • Cantilever Coating: B: Reflective Au
  • Tip Geometry: Standard
  • Number of Cantilevers: 1個(gè)懸臂
    F180KHz K40N/m L225um
AFM探針描述

適用的Sample:
Ceramics,Other Hard Samples,Polymers,Semiconductors

適用的AFM機(jī)型:
BioScopeResolve,DimensionIcon,DimensionXR,Innova,JPK,MultiMode,Non-Bruker

適用的Work Mode:
CAFM,contact,Nanoindentation,PeakForce QNM,peakforce tapping,PeakForce TUNA,tapping or non-contact,TUNA

適用的Application:
Electrical,General Topography,Mechanical Force Curves,Mechanical Property Mapping,Ultra Hi-Res

Coating 描述
cantilever Back side coating Reflective Au
tip coating Highly conductive single crystal diamond
Tip 規(guī)格
tip geometry Standard
tip radius (Nom) <5nm
tip height 12.5±2.5um
Front Angle (FA) 25±5°
Back Angle (BA) 15±5°
Side Angle (SA) 22.5±5°
Cantilever 規(guī)格
cantilever geometry Rectangular
K(Nom) 40N/m
Frequency(Nom) 180KHz
length(Nom) 225um
thickness(Nom) 3.0um
cantilever material Single Crystal Diamond
top layer back --
最新產(chǎn)品
Frequency
Nom: 70KHz
Spring Const.
Nom: 2.9N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom: 300KHz
Spring Const.
Nom: 42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom: 300KHz
Spring Const.
Nom: 42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom: 70KHz
Spring Const.
Nom: 2.9N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
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